DocumentCode
2900036
Title
Design and characterization of high performance 60 GHz pseudomorphic MODFET LNAs in CPW-technology based on accurate S-parameter and noise models
Author
Schlechtweg, M. ; Reinert, W. ; Tasker, P.J. ; Bosch, R. ; Braunstein, J. ; Hulsmann, A. ; Kohler, K.
Author_Institution
Fraunhofer-Inst. fuer Angewandte Festkorperphysik, Freiburg, Germany
fYear
1992
fDate
1-3 June 1992
Firstpage
29
Lastpage
32
Abstract
Low-noise V-band two-stage amplifiers were fabricated using pseudomorphic MODFETs. They exhibited 10.5-dB gain and a 5.2-dB noise figure at 58.5 GHz, in very close agreement with results predicted in advance. The CAE models for the transistors and the passive coplanar waveguide (CPW) components were extracted from on-wafer S-parameter measurements up to 60 GHz and noise parameter measurements up to 18 GHz. For noise modeling of the MODFETs up to millimeter-wave frequencies, a novel approach based on the temperature-noise model reported by M.W. Pospiezalski (1989) was used. Very good agreement between simulated and measured monolithic microwave integrated circuit (MMIC) gain and noise performances was achieved up to the V-band by using these models.<>
Keywords
MMIC; S-parameters; field effect integrated circuits; high electron mobility transistors; microwave amplifiers; semiconductor device models; semiconductor device noise; 0.2 to 63.2 GHz; 10.5 dB; 5.2 dB; 58.5 GHz; CAE models; CPW-technology; GaAs substrate; MMIC gain; S-parameter; V-band two-stage amplifiers; millimeter-wave frequencies; noise modeling; noise parameter; passive coplanar waveguide components; pseudomorphic MODFET LNA; temperature-noise model; Coplanar waveguides; HEMTs; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit noise; Low-noise amplifiers; MMICs; MODFET integrated circuits; Noise figure; Noise measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1992. Digest of Papers, IEEE 1992
Conference_Location
Albuquerque, NM, USA
Print_ISBN
0-7803-0677-5
Type
conf
DOI
10.1109/MCS.1992.185989
Filename
185989
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