• DocumentCode
    2900108
  • Title

    Response of electrohydrodynamic convection to external noise

  • Author

    Huh, Jong-Hoon ; Cui, Xiangwen

  • Author_Institution
    Dept. of Mech. Inf. Sci. & Technol., Kyushu Inst. of Technol., Fukuoka, Japan
  • fYear
    2011
  • fDate
    12-16 June 2011
  • Firstpage
    258
  • Lastpage
    261
  • Abstract
    We report noise-induced threshold shifts in ac-driven electrohydrodynamic convection (EHC) in nematic liquid crystals. By changing the intensity VN and cutoff frequency fc of noise, we investigate EHC-threshold shifts. There exists the characteristic cutoff frequency fc* for the influence of noise on EHC. For cutoff frequencies fc >; fc*, noise contributes to stabilizing the onset of EHC (i.e., it shifts the onset threshold upward), whereas for fc <; fc*, noise contributes to destabilizing the onset of EHC (i.e., it shifts the onset threshold downward). For fc = fc*, noise makes no contribution to the threshold shift (i.e., it is neutral with respect to the onset of EHC). However, the pattern structure of EHC is changed by VN, independent of fc.
  • Keywords
    convection; electrohydrodynamics; nematic liquid crystals; pattern formation; ac-driven electrohydrodynamic convection; cutoff frequency; external noise effect; nematic liquid crystals; noise-induced threshold shifts; pattern structure; Cutoff frequency; Sensitivity; electrohydrodynamic convection; nematic liquid crystals; noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Noise and Fluctuations (ICNF), 2011 21st International Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4577-0189-4
  • Type

    conf

  • DOI
    10.1109/ICNF.2011.5994316
  • Filename
    5994316