• DocumentCode
    2900379
  • Title

    Low-field I-V Method For Improved Dielectric Reliability

  • Author

    Klema, Jon E.

  • Author_Institution
    Motorola Incorporated
  • fYear
    1992
  • fDate
    25-28 Oct. 1992
  • Firstpage
    133
  • Lastpage
    136
  • Keywords
    BiCMOS integrated circuits; Circuit stability; Dielectric breakdown; Electric breakdown; Electrodes; Manufacturing; Monitoring; Production; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Level Reliability Workshop, 1992. Final Report., 1992 International
  • Conference_Location
    Lake Tahoe, CA, USA
  • Type

    conf

  • DOI
    10.1109/IWLR.1992.657995
  • Filename
    657995
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2900379