DocumentCode
2900765
Title
Supercapacitors in bias systems for low frequency noise measurements
Author
Scandurra, Graziella ; Ciofi, Carmine
Author_Institution
Dip. Fis. della Materia e Ing. Elettron., Univ. of Messina, Messina, Italy
fYear
2011
fDate
12-16 June 2011
Firstpage
389
Lastpage
392
Abstract
We explore the possibility of employing supercapacitors in the design of very low noise programmable voltage and current sources to be used for biasing the device under test in low frequency noise measurements. This is accomplished by taking advantage of the large capacitance of supercapacitors for realizing a low pass filter with a very low frequency corner for filtering out the noise produced by a solid state high accuracy DA converter. In order to obtain the desired attenuation of the noise down to a few hundred mHz, a very low frequency corner must be employed, thus resulting in very long transients (in the order of a few hours) upon each voltage change. This problem is specifically addressed in this paper. Indeed, we have designed a programmable voltage reference capable of generating voltages in the range 0-2.5 V with a resolution of about 2.5 mV, an accuracy better than 2 mV and a settling time of about 200 s. The output noise is below 4×10-16, 5×10-18, and 1×10-18 V2/Hz at 100 mHz, 1 Hz, and 10 Hz, respectively. The application of such a low voltage reference for the realization of a very low noise programmable current source is also discussed and demonstrated.
Keywords
constant current sources; digital-analogue conversion; electric noise measurement; integrated circuit noise; integrated circuit testing; low-pass filters; programmable circuits; semiconductor device noise; supercapacitors; bias system; device under test; frequency corner; low frequency noise measurement; low pass filter; noise filtering; programmable voltage reference; solid state high accuracy DA converter; supercapacitors; very low noise programmable current source design; very low noise programmable voltage source design; Frequency measurement; Noise; Noise measurement; Resistance; Supercapacitors; Voltage measurement; low frequency noise measurements; programmable bias sources; supercapacitor;
fLanguage
English
Publisher
ieee
Conference_Titel
Noise and Fluctuations (ICNF), 2011 21st International Conference on
Conference_Location
Toronto, ON
Print_ISBN
978-1-4577-0189-4
Type
conf
DOI
10.1109/ICNF.2011.5994351
Filename
5994351
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