Title :
Fault-tolerant design of VLSI circuits and systems
Author :
Reddy, Pratapa V C V
Author_Institution :
Dept. of Comput. & Electr. Eng., Rochester Inst. of Technol., NY, USA
Abstract :
The ever-increasing complexity of very large scale integration (VLSI) has a considerable impact on the design and implementation of fault-tolerant circuits and systems. The techniques of fault-tolerance are well established. VLSI, however, introduces problems in fault-tolerant design. An overview of the design and implementation of fault-tolerant systems in a VLSI environment is presented
Keywords :
VLSI; circuit reliability; integrated circuit technology; redundancy; VLSI circuits; fault-tolerant design; very large scale integration; Circuit faults; Circuits and systems; Diffusion bonding; Fault diagnosis; Fault tolerance; Fault tolerant systems; Integrated circuit reliability; Packaging; Redundancy; Very large scale integration;
Conference_Titel :
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location :
Rochester, NY
DOI :
10.1109/ASIC.1990.186075
