Serpentine waveguide 220 GHz millimeter wave amplifier cold test

Author

Cook, Alan M. ; Joye, Colin D. ; Calame, Jeffrey P. ; Nguyen, Khanh T. ; Vlasov, Alexander ; Wright, Edward L. ; Abe, David K. ; Levush, Baruch

Author_Institution

US Naval Res. Lab., Washington, DC, USA

fYear

2012

fDate

24-26 April 2012

Firstpage

547

Lastpage

548

Abstract

We present results of an electromagnetic cold-test of an all-copper, microfabricated 220 GHz serpentine waveguide amplifier circuit. Transmission/reflection measurements are used to determine the ohmic loss, pass band, and cutoff frequency. We observe the effects of fabrication accuracy, including circuit depth and beam tunnel alignment, on the measured electromagnetic properties.

Keywords

electromagnetic wave reflection; electromagnetic wave transmission; microfabrication; millimetre wave amplifiers; millimetre wave measurement; slow wave structures; all-copper serpentine waveguide amplifier circuit; beam tunnel alignment; circuit depth; cutoff frequency; electromagnetic cold-test; electromagnetic property; fabrication accuracy; frequency 220 GHz; microfabricated serpentine waveguide amplifier circuit; millimeter wave amplifier cold test; ohmic loss; pass band; reflection measurement; transmission measurement; Bandwidth; Electromagnetic waveguides; Fabrication; Loss measurement; Reflection; Solid modeling; Transmission line measurements; microfabrication; millimeter wave amplifier; serpentine folded waveguide; slow wave structure;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International

Conference_Location

Monterey, CA

Print_ISBN

978-1-4673-0188-6

Electronic_ISBN

978-1-4673-0187-9

Type

conf

DOI

10.1109/IVEC.2012.6262272

Filename

6262272