DocumentCode

2901523

Title

Wafer Level Autoclave

Author

Matosevich, Aviram ; Lisenker, Boris

Author_Institution

National Semiconductor

fYear

1992

fDate

25-28 Oct. 1992

Firstpage

167

Lastpage

168

Keywords

Acceleration; Corrosion; Moisture; Packaging; Passivation; Qualifications; Resists; Stress; Testing; Wafer scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Wafer Level Reliability Workshop, 1992. Final Report., 1992 International

Conference_Location

Lake Tahoe, CA, USA

Type

conf

DOI

10.1109/IWLR.1992.658001

Filename

658001