• DocumentCode
    2901528
  • Title

    Low frequency noise in organic solar cells

  • Author

    Katsu, Hideaki ; Kawasugi, Yoshitaka ; Yamada, Ryo ; Tada, Hirokazu

  • Author_Institution
    Div. of Mater. Phys., Osaka Univ., Toyonaka, Japan
  • fYear
    2011
  • fDate
    12-16 June 2011
  • Firstpage
    77
  • Lastpage
    79
  • Abstract
    The conduction mechanism in organic heterojunction solar cells (OHSCs) has been discussed based on the results of low frequency noise spectroscopy. We prepared OHSCs composed of poly-(2-methoxy-5-(3´,7´-dimethyloctyloxy)-1,4-phenylenevinylene), regioregular poly(3-hexylthiophene) and [6,6]-phenyl-C61-butyric acid methyl ester. The devices prepared exhibited 1/f noise at the bias voltage range from +2 V (forward) to -2 V (reverse). It was found that there were three regimes in the noise spectral density Si(f) in the forward bias voltage region. In the ohmic regime, Si(f) increased in proportional to the square of current. In the trap filling regime, Si(f) was constant, while it increased again in the space charge limited current regime. In addition to this behavior, the noise spectra of OHSCs in the reverse bias voltage region exhibited the superposition of 1/f noise and the generation-recombination noise indicating the existence of carrier trap sites. These phenomena observed were thought to result from the breakdown and/or alleviation of the conduction path, which was caused by thermal stress of current flow.
  • Keywords
    noise; semiconductor devices; solar cells; thermal stresses; OHSCs noise spectra; conduction mechanism; forward bias voltage region; generation recombination noise; low frequency noise; low frequency noise spectroscopy; noise spectral density; organic heterojunction solar cells; organic solar cell; thermal stress; Fluctuations; Low-frequency noise; Noise measurement; Photovoltaic cells; Semiconductor device measurement; Voltage measurement; 1/ƒ noise; low frequency noise; organic solar cell; power spectral density; variable range hopping conduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Noise and Fluctuations (ICNF), 2011 21st International Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4577-0189-4
  • Type

    conf

  • DOI
    10.1109/ICNF.2011.5994389
  • Filename
    5994389