DocumentCode
2901651
Title
Temporal particle-in-cell analysis in Beam Optics Analyzer
Author
Bui, Thuc ; Read, Michael ; Ives, Lawrence
Author_Institution
Calabazas Creek Res. Inc., Mountain View, CA, USA
fYear
2011
fDate
21-24 Feb. 2011
Firstpage
179
Lastpage
179
Abstract
This paper will describe the new feature, temporal particle-in-cell analysis in Beam Optics Analyzer in detail. Algorithms for pushing particles and field solution will be discussed. Numerical results for a diode as well as a gridded electron gun will demonstrate the implementation.
Keywords
electron guns; optics; beam optics analyzer; gridded electron gun; temporal particle-in-cell analysis; Electric potential; Klystrons; Optical beams; Optics; Particle beams; Radio frequency; Trajectory; BOA; PIC; electron guns; temporal;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2011 IEEE International
Conference_Location
Bangalore
Print_ISBN
978-1-4244-8662-5
Type
conf
DOI
10.1109/IVEC.2011.5746934
Filename
5746934
Link To Document