مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2901719

Title :

Methodology for Designing-In Reliability

Author :

Veeraraghavan, Surya

Author_Institution :

Motorola Advanced Froducts Research and Development Laboratory

fYear :

1992

fDate :

25-28 Oct. 1992

Firstpage :

169

Lastpage :

175

Keywords :

Circuit simulation; Degradation; Design methodology; Design optimization; Electromigration; Hot carriers; Laboratories; Predictive models; Research and development; Semiconductor device modeling;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Wafer Level Reliability Workshop, 1992. Final Report., 1992 International

Conference_Location :

Lake Tahoe, CA, USA

Type :

conf

DOI :

10.1109/IWLR.1992.658002

Filename :

658002

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2901719