• DocumentCode
    2901726
  • Title

    Application of covariance based models to fit response surfaces to experimental data

  • Author

    Redford, M. ; Walton, A.J. ; Sprevak, D. ; Ferguson, R.S.

  • Author_Institution
    Nat. Semicond., Greenock, UK
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    42
  • Lastpage
    45
  • Abstract
    Experimental design together with the response surface methodology (RSM) are important tools that can be employed to help optimise IC processes (Walton et al, 1997). This paper presents a method of fitting a response surface to experimental data when there are one or more data points that are poorly fitted by conventional polynomial models. The method is based on first fitting the data with a polynomial model and using this to calculate a worksheet for the combinations of control factors that were used in the original experiment. The actual experimental conditions for the poorly fitting points are then substituted into this worksheet and a covariance fit used to fit the data. The resulting surface follows the general trend while also fitting measurement points where there is confidence that there is no significant experimental error
  • Keywords
    covariance analysis; design of experiments; integrated circuit measurement; optimisation; semiconductor process modelling; surface fitting; IC process optimization; control factors; covariance based models; covariance fit; data fitting; data points; experimental data; experimental design; measurement points; polynomial models; poorly fitting points; response surface; response surface fitting; response surface methodology; significant experimental error; worksheet; Computational modeling; Computer errors; Data engineering; Design for experiments; Design optimization; Electronics industry; Industrial electronics; Polynomials; Response surface methodology; Surface fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Statistical Metrology, 1999. IWSM. 1999 4th International Workshop on
  • Conference_Location
    Kyoto
  • Print_ISBN
    0-7803-5154-1
  • Type

    conf

  • DOI
    10.1109/IWSTM.1999.773192
  • Filename
    773192