DocumentCode
2901726
Title
Application of covariance based models to fit response surfaces to experimental data
Author
Redford, M. ; Walton, A.J. ; Sprevak, D. ; Ferguson, R.S.
Author_Institution
Nat. Semicond., Greenock, UK
fYear
1999
fDate
1999
Firstpage
42
Lastpage
45
Abstract
Experimental design together with the response surface methodology (RSM) are important tools that can be employed to help optimise IC processes (Walton et al, 1997). This paper presents a method of fitting a response surface to experimental data when there are one or more data points that are poorly fitted by conventional polynomial models. The method is based on first fitting the data with a polynomial model and using this to calculate a worksheet for the combinations of control factors that were used in the original experiment. The actual experimental conditions for the poorly fitting points are then substituted into this worksheet and a covariance fit used to fit the data. The resulting surface follows the general trend while also fitting measurement points where there is confidence that there is no significant experimental error
Keywords
covariance analysis; design of experiments; integrated circuit measurement; optimisation; semiconductor process modelling; surface fitting; IC process optimization; control factors; covariance based models; covariance fit; data fitting; data points; experimental data; experimental design; measurement points; polynomial models; poorly fitting points; response surface; response surface fitting; response surface methodology; significant experimental error; worksheet; Computational modeling; Computer errors; Data engineering; Design for experiments; Design optimization; Electronics industry; Industrial electronics; Polynomials; Response surface methodology; Surface fitting;
fLanguage
English
Publisher
ieee
Conference_Titel
Statistical Metrology, 1999. IWSM. 1999 4th International Workshop on
Conference_Location
Kyoto
Print_ISBN
0-7803-5154-1
Type
conf
DOI
10.1109/IWSTM.1999.773192
Filename
773192
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