DocumentCode :
2901746
Title :
Preparation of nano-structure amorphous carbon film and its field emission properties
Author :
Zhang, Xinyue ; Lu, Zhanling ; Zhang, Binglin ; Yao, Ning ; Ma, Bingxian ; Zhao, Yongmei
Author_Institution :
Dept. of Phys., Zhengzhou Univ., China
fYear :
2004
fDate :
6-10 Sept. 2004
Firstpage :
293
Lastpage :
295
Abstract :
Nano-structure amorphous carbons films were fabricated on n-Si(111) substrates coated with titanium by microwave plasma chemical vapor deposition (MPCVD) system. The source gas was a mixture of H2 and CH4 with the flow rates of 100 sccm and 16 sccm, respectively. During the deposition, the total pressure of 6.0 KPa, substrates temperature of 830°C and microwave power of 1700W which were kept for 4 hours. The surface morphology and the nano-structure of the films were tested by field emission scanning electron microscopy (SEM), X-ray diffraction (XRD), Raman scattering spectroscopy and X-ray photoelectron spectroscopy (XPS). The results show that the film consists of carbon grain size of no more than 100 nm and the main component was amorphous carbon with the mixture of sp2 and sp3 bond. Field emission of as-deposited film was then measured at a vacuum of below 5×10-5Pa. It was found that the initial turn-on field was very low, which was about 0.6 V/μm; the current density of 2.5mA/cm2 was obtained under an electric field of 3.7 V/μm. The emission sites density was estimated to be more than 104/cm2 at electric field of 3.7V/μm. All these characteristics indicate that such deposited nano-structure amorphous carbon film is an efficient cold cathode material.
Keywords :
Raman spectroscopy; X-ray diffraction; X-ray spectroscopy; carbon compounds; electron field emission; hydrogen; materials testing; nanostructured materials; nanotechnology; noncrystalline structure; photoelectron spectroscopy; plasma CVD; scanning electron microscopy; silicon; surface morphology; thin films; titanium; 14400 s; 1700 W; 6.0 KPa; 830 C; CH4; H2; Raman scattering spectroscopy; Si; Ti; X-ray diffraction; X-ray photoelectron spectroscopy; carbon grain size; cold cathode material; current density; electric field; emission sites density; field electron emission; field emission measurement; field emission properties; field emission scanning electron microscopy; microwave plasma chemical vapor deposition system; n-Si111 substrate; nano-structure amorphous carbon film; source gas; surface morphology; titanium coating; turn-on field; Amorphous materials; Carbon dioxide; Plasma chemistry; Plasma properties; Plasma temperature; Raman scattering; Scanning electron microscopy; Spectroscopy; Substrates; Titanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference, 2004. Proceedings. IVESC 2004. The 5th International
Print_ISBN :
0-7803-8437-7
Type :
conf
DOI :
10.1109/IVESC.2004.1414243
Filename :
1414243
Link To Document :
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