• DocumentCode
    2901770
  • Title

    The nanoelectronic modeling tool NEMO 5: Capabilities, validation, and application to Sb-heterostructures

  • Author

    Steiger, Sebastian ; Povolotskyi, Michael ; Park, Hong-Hyun ; Kubis, Tillmann ; Hegde, Ganesh ; Haley, Benjamin ; Rodwell, Mark ; Klimeck, Gerhard

  • Author_Institution
    Network for Comput. Nanotechnol., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2011
  • fDate
    20-22 June 2011
  • Firstpage
    23
  • Lastpage
    26
  • Abstract
    Modeling and simulation take an important role in the exploration and design optimization of novel devices. As the downscaling of electronic devices continues, the description of interfaces, randomness, and disorder on an atomistic level gains importance and continuum descriptions lose their validity. Often a full-band description of the electronic structure is needed to model the interaction of different valleys and nonparabolicity effects. NEMO 5 is a modeling tool that addresses these issues and is able to provide insight into a broad range of devices. It unifies the capabilities of prior projects: multiscale approaches to quantum transport in planar structures in NEMO-ID, multimillion-atom simulations of strain and electronic structure in NEMO-3D and NEMO-3D-Peta, and quantum transport in nonplanar structures in OMEN. NEMO 5 aims at becoming a community code whose structure, implementation, resource requirements and license allow experimental and theoretical researchers in academia and industry alike to use and extend the tool.
  • Keywords
    antimony; electronic structure; nanoelectronics; NEMO 5; NEMO-3D-Peta; NEMO-ID; OMEN; electronic devices; electronic structure; multimillion-atom simulations; nanoelectronic modeling tool; planar structures; quantum transport; Artificial intelligence; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2011 69th Annual
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-61284-243-1
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2011.5994404
  • Filename
    5994404