DocumentCode :
2901812
Title :
Integration of high quality top-gated graphene field effect devices on 150 mm substrate
Author :
Heo, Jinseong ; Chung, Hyun-Jong ; Lee, Sung-Hoon ; Yang, Heejun ; Shin, Jaikwang ; Chung, U-in ; Seo, Sunae
Author_Institution :
Semicond. Device Lab., Samsung Adv. Inst. of Technol., Yongin, South Korea
fYear :
2011
fDate :
20-22 June 2011
Firstpage :
31
Lastpage :
32
Abstract :
Recent success of inexpensive and high-throughput chemical vapor deposition (CVD) growth of graphene on Ni or Cu substrates has shown promises for potential industrial applications such as transparent electrodes and field effect transistors (FET). However, high-coverage uniform growth of monolayer graphene on a wafer scale is still a major obstruction, which impedes high yield integration of high performance field effect devices. In this paper, the authors report the first demonstration of high quality top-gated graphene field effect devices on 150 mm substrates exploiting unprecedented homogeneous CVD growth of monolayer graphene.
Keywords :
CVD coatings; etching; field effect devices; graphene; C; chemical vapor deposition growth; high coverage uniform growth; high yield integration; monolayer graphene; size 150 mm; top gated graphene field effect device; wafer scale; Logic gates; Microscopy; Optical microscopy; Plasmas; Resistance; Substrates; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2011 69th Annual
Conference_Location :
Santa Barbara, CA
ISSN :
1548-3770
Print_ISBN :
978-1-61284-243-1
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2011.5994407
Filename :
5994407
Link To Document :
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