Title :
Dynamic fault detection chassis for the 1MW high voltage converter modulator system at the spallation neutron source
Author :
Mize, J.J. ; Anderson, D.E. ; Hicks, J. ; Wezensky, M.
Author_Institution :
Oak Ridge Nat. Lab., Oak Ridge
Abstract :
The high frequency switching megawatt-class High Voltage Converter Modulator (HVCM) developed by Los Alamos National Laboratory for the Oak Ridge National Laboratory´s Spallation Neutron Source (SNS) is now in operation. One of the major problems with the modulator systems is shoot-thru conditions that can occur in an IGBT H-bridge topology resulting in large fault currents and device failure in a few microseconds. The Dynamic Fault Detection Chassis (DFDC) is a fault monitoring system. It monitors transformer flux saturation using a window comparator and dV/dt events on the cathode voltage caused by any abnormality such as capacitor breakdown, transformer primary turns shorts, or dielectric breakdown between the transformer primary and secondary. If faults are detected, the DFDC will inhibit the IGBT gate drives and shut the system down, significantly reducing the possibility of a shoot- thru condition or other equipment damaging events. In this paper, we will present system integration considerations, performance characteristics of the DFDC, and discuss its ability to significantly reduce costly down time for the entire facility.
Keywords :
convertors; failure analysis; fault currents; insulated gate bipolar transistors; modulators; IGBT H-bridge topology; Spallation Neutron Source; capacitor breakdown; device failure; dielectric breakdown; dynamic fault detection chassis; fault currents; fault monitoring system; high-voltage converter modulator system; power 1 MW; shoot-thru conditions; transformer flux saturation; Breakdown voltage; Circuit faults; Dielectric breakdown; Fault detection; Frequency conversion; Insulated gate bipolar transistors; Laboratories; Neutrons; Switching converters; Topology;
Conference_Titel :
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0916-7
DOI :
10.1109/PAC.2007.4441301