Title :
Autonomous test scheme for analog ASICs
Author_Institution :
North American Philips Corp., Briarcliff Manor, NY, USA
Abstract :
Analog autonomous test (AAT) is a structured design-for-testability methodology for mixed analog/digital ICs. By using analog switches and test-bus to gain controllability and observability, a chip is partitioned into testable submodules for production testing. Therefore, both test vector development period and production test time can be reduced
Keywords :
application specific integrated circuits; integrated circuit testing; linear integrated circuits; production testing; analog ASICs; analog autonomous test; analog switches; autonomous test scheme; controllability; design-for-testability; mixed analog/digital ICs; mixed mode ICs; observability; partitioning; production test time; production testing; test vector development; test-bus; testable submodules; Application specific integrated circuits; Circuit testing; Costs; Design methodology; Integrated circuit testing; Packaging; Performance evaluation; Production; Silicon; Switches;
Conference_Titel :
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location :
Rochester, NY
DOI :
10.1109/ASIC.1990.186145
