Title :
The chaotic character of ion relaxation oscillation in microwave tubes
Author :
Yubin Gong ; Huarong Gong ; Wang, Wenxiang ; Tang, Changjian
Author_Institution :
Coll. of Phys. Electron., China Univ. of Electron. Sci. & Technol., China
Abstract :
The noise caused by ion relaxation oscillation becomes a research focus in the field of microwave tubes recently because of the improvement of radars and communications requirements. In this paper, electron beam is described by beam envelope equation, and ions generated from ionization of the background gas in microwave tubes are treated as discrete macro-particles. One dimensional particle-in-cell (PIC) simulation code was developed, and time series of ion relaxation oscillation are obtained by the presented method. The ion relaxation oscillation is treated as the response of a complex nonlinear dynamical system, and the time series is analyzed by power spectrum; restructure phase diagram and Lyapunov exponent. From the analysis results, we find that the ion relaxation oscillation has chaotic character at the first time. The reason of chaos was attributed to the dissipative structure of the system. This would be useful for depressing relaxation oscillation and processing signal with relaxation oscillation noise.
Keywords :
Lyapunov methods; chaos; electron beams; ionisation; ionisation chambers; microwave tubes; noise; nonlinear dynamical systems; relaxation oscillators; time series; Lyapunov exponent; background gas; beam envelope equation; chaotic character; complex nonlinear dynamical system; discrete macro-particles; dissipative system structure; electron beam; ion relaxation oscillation; microwave tubes; particle-in-cell simulation code; power spectrum; relaxation oscillation noise; restructure phase diagram; time series; Chaos; Chaotic communication; Electron beams; Electron tubes; Equations; Ionization; Microwave communication; Microwave generation; Nonlinear dynamical systems; Radar;
Conference_Titel :
Vacuum Electron Sources Conference, 2004. Proceedings. IVESC 2004. The 5th International
Print_ISBN :
0-7803-8437-7
DOI :
10.1109/IVESC.2004.1414254