DocumentCode
2902306
Title
Behavioral models of ASIC VLSI cells
Author
Abel, James
Author_Institution
Intel Corp., Chandler, AZ, USA
fYear
1990
fDate
17-21 Sep 1990
Abstract
Behavioral models, while more difficult to produce than gate-level models, provide invaluable features during the design verification process. These models exhibit timing and functional accuracy, while providing significantly increased performance and debug features. Techniques to decrease the effort required to produce behavioral models of ASIC VLSI cells are discussed. Behavioral models of ASIC VLSI cells can greatly decrease the time required to verify a design
Keywords
VLSI; application specific integrated circuits; circuit CAD; semiconductor device models; ASIC VLSI cells; behavioral models; debug features; design verification process; Accuracy; Application specific integrated circuits; Circuit simulation; Delay estimation; Microcomputers; Propagation delay; Temperature; Timing; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location
Rochester, NY
Type
conf
DOI
10.1109/ASIC.1990.186170
Filename
186170
Link To Document