• DocumentCode
    2902306
  • Title

    Behavioral models of ASIC VLSI cells

  • Author

    Abel, James

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • fYear
    1990
  • fDate
    17-21 Sep 1990
  • Abstract
    Behavioral models, while more difficult to produce than gate-level models, provide invaluable features during the design verification process. These models exhibit timing and functional accuracy, while providing significantly increased performance and debug features. Techniques to decrease the effort required to produce behavioral models of ASIC VLSI cells are discussed. Behavioral models of ASIC VLSI cells can greatly decrease the time required to verify a design
  • Keywords
    VLSI; application specific integrated circuits; circuit CAD; semiconductor device models; ASIC VLSI cells; behavioral models; debug features; design verification process; Accuracy; Application specific integrated circuits; Circuit simulation; Delay estimation; Microcomputers; Propagation delay; Temperature; Timing; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
  • Conference_Location
    Rochester, NY
  • Type

    conf

  • DOI
    10.1109/ASIC.1990.186170
  • Filename
    186170