Title :
Bridges in sequential CMOS circuits: current-voltage signature
Author :
Rodriguez-Montanes, R. ; Figueras, J.
Author_Institution :
Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
fDate :
27 Apr-1 May 1997
Abstract :
The IDDQ-VDD signature for sequential CMOS circuits with bridging defects is characterized. In combinational circuits with a bridging defect, an increase in VDD results in a higher IDDQ value flowing through the defect, however, the total current may decrease as it will be shown. In sequential circuits with bridging defects connecting control loop nodes, the VDD-IDDQ signature may present intervals of constant non defective IDDQ value. The signature may be used to diagnose certain types of bridging defects in sequential CMOS circuits
Keywords :
CMOS logic circuits; fault diagnosis; integrated circuit testing; logic testing; sequential circuits; IDDQ-VDD signature; bridging defects; control loop nodes; current-voltage signature; fault diagnosis; sequential CMOS circuits; temperature dependence; Bridge circuits; CMOS memory circuits; CMOS process; Circuit faults; Circuit testing; Joining processes; Power supplies; Sequential analysis; Sequential circuits; Voltage;
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-7810-0
DOI :
10.1109/VTEST.1997.599443
