A Simple Statistical Model for Turbulence-Induced Fading in Free-Space Optical Systems

Author

Chatzidiamantis, Nestor D. ; Sandalidis, Harilaos G. ; Karagiannidis, George K. ; Matthaiou, Michail

Author_Institution

Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece

fYear

2010

fDate

23-27 May 2010

Firstpage

1

Lastpage

5

Abstract

In this paper, we propose the Inverse Gaussian (IG) distribution, as a less complex alternative to Log-normal (LN), to describe turbulence-induced fading in free-space optical (FSO) systems operating in weak turbulence conditions and/or in the presence of a large amount of aperture averaging. By conducting goodness of fit tests, we define the range of values of the scintillation index, where the two distributions approximate each other, with a certain significance level. The efficiency of the new model is pointed out by deriving analytical expressions for the calculation of the bit-error rate of two typical FSO systems; an intensity-modulation/direct detection FSO system with M-ary pulse position modulation and a heterodyne FSO system with differential phase shift keying. Numerical examples are provided to clearly illustrate the accuracy of the proposed approach in the weak turbulence regime.

Keywords

Gaussian distribution; differential phase shift keying; error statistics; optical communication; optical modulation; pulse position modulation; space communication links; M-ary pulse position modulation; aperture averaging; bit-error rate; differential phase shift keying; direct detection free-space optical system; heterodyne free-space optical system; intensity-modulation free-space optical system; inverse Gaussian distribution; log-normal; scintillation index; statistical model; turbulence-induced fading; Apertures; Bit error rate; Fading; Intensity modulation; Optical mixing; Phase detection; Phase modulation; Pulse modulation; Solid scintillation detectors; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Communications (ICC), 2010 IEEE International Conference on

Conference_Location

Cape Town

ISSN

1550-3607

Print_ISBN

978-1-4244-6402-9

Type

conf

DOI

10.1109/ICC.2010.5502065

Filename

5502065