• DocumentCode
    2902410
  • Title

    Direct access test scheme-implementation and verification in embedded ASIC designs

  • Author

    Immaneni, V. ; Puffer, David ; Raman, Srinivas

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • fYear
    1990
  • fDate
    17-21 Sep 1990
  • Abstract
    The direct access test scheme (DATS) that eliminates the designer´s burden of embedded block cell test generation is discussed. This scheme provides for testing of embedded block cells using proven test vectors. The implementation and automatic verification of DATS in ASIC designs is discussed
  • Keywords
    application specific integrated circuits; integrated circuit testing; logic testing; automatic verification; block cell test generation; direct access test scheme; embedded ASIC designs; logic block testing; Amplitude shift keying; Application specific integrated circuits; Automatic testing; Libraries; Logic design; Logic testing; Microcomputers; Microprocessors; Packaging; Pins;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
  • Conference_Location
    Rochester, NY
  • Type

    conf

  • DOI
    10.1109/ASIC.1990.186177
  • Filename
    186177
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2902410