• DocumentCode
    2902543
  • Title

    Using fault sampling to compute IDDQ diagnostic test sets

  • Author

    Gong, Yiming ; Chakravarty, Sreejit

  • Author_Institution
    Quickturn Syst. Inc., Mountain View, CA, USA
  • fYear
    1997
  • fDate
    27 Apr-1 May 1997
  • Firstpage
    74
  • Lastpage
    79
  • Abstract
    A diagnostic test generation system for computing IDQQ diagnostic test sets for bridging faults in combinational circuits is presented. The system uses fault sampling. Experimental results presented show that fault sampling is a very effective method for computing diagnostic test sets, especially when the number of target faults is very large
  • Keywords
    combinational circuits; fault diagnosis; logic testing; IDDQ diagnostic test set generation; bridging faults; combinational circuit; fault sampling; Circuit faults; Circuit testing; Fault detection; Sampling methods; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1997., 15th IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7810-0
  • Type

    conf

  • DOI
    10.1109/VTEST.1997.599444
  • Filename
    599444
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2902543