Title :
Chip-To-Chip Interconnection by Mechanical Caulking Using Reflowed Sn Bumps
Author :
Yang, Ju-heon ; Kim, Young-Ho ; Moon, Jae-Seung ; Lee, Won-Jong
Author_Institution :
Hanyang Univ., Seoul
Abstract :
A new chip-to-chip interconnection method utilizing mechanical caulking has been developed recently. In this method, bonding between the chips is achieved by deformation-injection of Au stud bump on a chip into the through via hole in the other chip. In this paper, we introduce a modified caulking technology using reflowed Sn bumps instead Au stud bumps since Sn can be deformed more easily than Au. The chip-to-chip interconnection using reflowed Sn bumps and through via hole electrodes was successfully made at room temperature or at 270degC. The contact resistance of the solder joint was less than 35 mOmega per joint.
Keywords :
integrated circuit bonding; integrated circuit interconnections; integrated circuit packaging; reflow soldering; sealing materials; tin; Sn; chip bonding; chip-to-chip interconnection; contact resistance; deformation-injection; hole electrodes; mechanical caulking; reflowed tin bumps; solder joint; temperature 270 C; temperature 293 K to 298 K; three-dimensional packaging technology; Bonding; Electrodes; Gold; Materials science and technology; Packaging; Sputter etching; Sputtering; Temperature; Tin; Wet etching;
Conference_Titel :
Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1392-8
Electronic_ISBN :
978-1-4244-1392-8
DOI :
10.1109/ICEPT.2007.4441380