Title :
15th Asian Test Symposium - Title
Abstract :
The following topics are dealt with: memory testing; design verification; reliable circuit design; analog DFT; defect ATPG; built-in testing; DFT for processors and ASICs; and scan testing
Keywords :
application specific integrated circuits; automatic test pattern generation; boundary scan testing; built-in self test; design for testability; integrated circuit design; semiconductor storage; application specific integrated circuits; automatic test pattern generation; built-in self test; design for testability; design verification; memory testing; reliable circuit design; scan test;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.260973
