DocumentCode
2903089
Title
15th Asian Test Symposium - Title
fYear
2006
fDate
20-23 Nov. 2006
Abstract
The following topics are dealt with: memory testing; design verification; reliable circuit design; analog DFT; defect ATPG; built-in testing; DFT for processors and ASICs; and scan testing
Keywords
application specific integrated circuits; automatic test pattern generation; boundary scan testing; built-in self test; design for testability; integrated circuit design; semiconductor storage; application specific integrated circuits; automatic test pattern generation; built-in self test; design for testability; design verification; memory testing; reliable circuit design; scan test;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location
Fukuoka
ISSN
1081-7735
Print_ISBN
0-7695-2628-4
Type
conf
DOI
10.1109/ATS.2006.260973
Filename
4030720
Link To Document