• DocumentCode
    2903183
  • Title

    Orthogonal spin transfer MRAM

  • Author

    Bedau, Daniel ; Backes, D. ; Liu, H. ; Langer, J. ; Manandhar, P. ; Kent, A.D.

  • Author_Institution
    Dept. of Phys., New York Univ., New York, NY, USA
  • fYear
    2011
  • fDate
    20-22 June 2011
  • Firstpage
    165
  • Lastpage
    166
  • Abstract
    Spin-Transfer Magnetic Random Access Memory (ST-MRAM) devices hold great promise as a universal memory [Katine 2008]. ST-MRAM is non-volatile, has a small cell size, high endurance and may match the speed of SRAM. A disadvantage of the common collinearly magnetized ST-MRAM is their non-deterministic switching process, which leads to long switching times and broad switching time distributions [Devolder 2008, Koch 2004]. This delay is due to the fact that the torque is zero if the layers are either parallel or antiparallel [Slonczewski 1996] and hence switching cannot be initiated by the torque alone. Typically the process is started by an initial misalignment of the free layer stemming from thermal excitations. Relying on thermal initiation leads to incoherent reversal with an unpredictable incubation delay in the ns range [Devolder 2008] and broad switching time distributions [Koch 2004].
  • Keywords
    MRAM devices; broad switching time distributions; orthogonal spin transfer MRAM; spin-transfer magnetic random access memory; thermal excitations; thermal initiation; universal memory; Lead; Optical polarization; Optical switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2011 69th Annual
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-61284-243-1
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2011.5994472
  • Filename
    5994472