• DocumentCode
    2903208
  • Title

    Fracture Simulation of Solder Joints by a Lattice Model

  • Author

    An, Tong ; Qin, Fei

  • Author_Institution
    Beijing Univ. of Technol., Beijing
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Solder joints serve as mechanical, thermal and electrical interconnections between the electronic packages and the printed circuit board (PCB). Fracture of the solder joint is the most common failure mechanism in microsystem packages due to mechanical loads. In order to satisfy the demand for understanding the process of solder joint fracture, there is a need for a validated model, which is simple, reliable, and able to clarify of physics-of-failure of solder joint for design improvement. In this paper, the lattice model has been established to simulate the process of solder joint fracturing. The results show that the proposed lattice model can easily be used to predict the cracking of solder joint under tensile loading. The predicted crack pattern agrees well with that observed in experiments.
  • Keywords
    cracks; failure analysis; fracture mechanics; integrated circuit design; integrated circuit packaging; integrated circuit reliability; interconnections; lattice theory; solders; tensile testing; crack pattern; electrical interconnections; electronic packages; failure mechanism; fracture simulation; lattice model; mechanical interconnections; mechanical loads; microsystem packages; printed circuit board; solder joint cracking; solder joint fracture; solder joints; tensile loading; thermal interconnections; Building materials; Concrete; Deformable models; Electronic packaging thermal management; Integrated circuit interconnections; Lattices; Mechanical engineering; Soldering; Structural beams; Thermal engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441406
  • Filename
    4441406