DocumentCode
2903286
Title
Field emission current from multipoint nanoemission matrix, taking into account the statistical nature of the distribution of the field enhancement factor. Determination of the statistic distribution of the field enhancement factor of anoemission matrix o
Author
Korolev, Sergey V.
Author_Institution
State Sci. Center Russian Federation, Fed. State Unitary Enterprise All-Russia Electron. Tech. Inst., Moscow, Russia
fYear
2011
fDate
21-24 Feb. 2011
Firstpage
361
Lastpage
362
Abstract
A method is considered for determining the statistical distribution function of the field enhancement factor matrix nanoscale field emission structures from the results of emission testing. The method is based on the work of academician A.N. Tikhonov, associated with the decision of inverse ill-posed problems described by the Fredholm equation 1-st kind. In deciding it was taken into account that the emission current equation is the equation of Fredholm 1-st kind on the multiplication of argument. This made it possible to use an efficient algorithm associated with the Fourier transform of the functional and unusual. The results of numerical modeling for solving direct and inverse problems are given. The correctness of the solutioning shown, its stability and convergence to the exact solution, the error of initial information tending to zero.
Keywords
Fourier transforms; Fredholm integral equations; field emission; field emitter arrays; matrix algebra; statistical distributions; Fourier transform; Fredholm equation 1-st kind; emission current equation; emission testing; field emission current; field emitter; field enhancement factor matrix; inverse ill-posed problem; multipoint nanoemission matrix; nanoscale field emission structure; statistic distribution; Algorithm design and analysis; Convergence; Equations; Fourier transforms; Integral equations; Kernel; Mathematical model; distribution; emission investigation; enhancement factor; field emitter;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2011 IEEE International
Conference_Location
Bangalore
Print_ISBN
978-1-4244-8662-5
Type
conf
DOI
10.1109/IVEC.2011.5747025
Filename
5747025
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