• DocumentCode
    2903432
  • Title

    The Study for Thermal Analysis Technology of Three-Dimension SRAM Component

  • Author

    Cao, Yusheng ; Jiang, Tong ; Liu, Jun ; Lian, Binhao

  • Author_Institution
    Beijing Microelectronics Technology Institute MXTronics Corporation, Beijing 100076, China. Email: cys0113@sohu.com
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The thermal capacity of unit volume is increasing with the development of 3D IC package density. The technology of thermal analysis and thermal design for 3D package becomes more and more important. This paper analyzes the structure and working mode of a particular 3D SRAM component. The thermal distribution is simulated with the Ansys software in which the finite element method is applied. The simulation results can be well compared with the experimental data, which further supports the reliability design of 3D SRAM package technology and the thermal analysis technology.
  • Keywords
    Analytical models; Electronic packaging thermal management; Electronics packaging; Microelectronics; Occupational stress; Random access memory; SRAM chips; Temperature distribution; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441418
  • Filename
    4441418