DocumentCode

2903506

Title

Customer and Summary Report Management Acceptance Of Bir Group Discussion

Author

Crook, Danny

fYear

1992

fDate

25-28 Oct. 1992

Firstpage

233

Lastpage

237

Keywords

Conductors; Engineering management; Manufacturing; Reliability engineering; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Wafer Level Reliability Workshop, 1992. Final Report., 1992 International

Conference_Location

Lake Tahoe, CA, USA

Type

conf

DOI

10.1109/IWLR.1992.658011

Filename

658011