DocumentCode
2903589
Title
A Functional Fault Model with Implicit Fault Effect Propagation Requirements
Author
Pomeranz, Irith ; Patil, Srinivas ; Parvathala, Praveen K.
Author_Institution
Sch. of ECE, Purdue Univ., W. Lafayette, IN
fYear
2006
fDate
Nov. 2006
Firstpage
95
Lastpage
102
Abstract
We define a functional fault model that does not include explicit fault effect propagation requirements. Test generation for this functional fault model is done considering only a fault free circuit. This simplifies the functional test generation process. We demonstrate through experimental results that functional test sequences generated based on this model are effective in providing very high gate-level stuck-at fault coverage
Keywords
automatic test pattern generation; fault diagnosis; finite state machines; integrated circuit testing; fault effect propagation requirements; fault free circuit; functional fault model; functional test generation process; gate-level stuck-at fault coverage; test sequences generated; Benchmark testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Observability; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location
Fukuoka
ISSN
1081-7735
Print_ISBN
0-7695-2628-4
Type
conf
DOI
10.1109/ATS.2006.260999
Filename
4030747
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