Title :
A Soft Error Tolerant LUT Cascade Emulator
Author :
Nakahara, Hiroki ; Sasao, Tsutomu
Author_Institution :
Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Iizuka
Abstract :
An LUT cascade emulator realizes an arbitrary sequential circuit. Given a sequential circuit, we convert the combinational part into one or more LUT cascades, and store LUT (cell) data into a memory in the LUT cascade emulator. The emulator evaluates multi-output logic functions by reading cell data sequentially. To improve the tolerance to soft errors, cell data in the memory are encoded by error correcting codes. Also, error-correcting circuits and checking circuits that periodically scan the memories are appended. When a soft error is detected, it removes the error by rewriting the correct data into the memory. To mask soft errors in flip-flops, a TMR (triple module redundancy) technique is employed. Our system detects a soft error in a single bit. Also, the mission time of the system is more than 1000times of time of an ordinary LUT cascade emulator
Keywords :
cascade networks; error correction codes; flip-flops; redundancy; sequential circuits; table lookup; LUT cascade emulator; TMR; checking circuits; error correcting codes; flip flops; multi output logic functions; sequential circuit; soft error tolerant; triple module redundancy; Computer errors; Computer science; Error correction; Error correction codes; Field programmable gate arrays; Integrated circuit interconnections; Redundancy; Registers; Sequential circuits; Table lookup;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.261002