DocumentCode :
2903841
Title :
Thermal Profiling to Overcome Flux Residue Formation in a No-clean Solder Paste for Lead-free Surface Mount Technology
Author :
Buenaflor, Leah ; Dal, Sheila Liza ; Estinozo, Ian
Author_Institution :
Intel Technol. Philippines, Inc., Cavite
fYear :
2007
fDate :
14-17 Aug. 2007
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents the behavior of SnAgCu (SAC) solder paste when analyzed using thermal profiling when exposed to (1) conventional reflow and (2) newly adjusted profiles. Thermal gravimetric analyzer (TGA) was used extensively to study the thermal properties of the flux and to simulate the heating processes the material undergoes during ball-attach reflow process. Experiments have proved that slower ramp rate will allow gradual evaporation of volatiles prior the non-volatile reaction of flux material at soak zone. This understanding of the reaction that takes place prior to soak zone will enable ball-attach engineers to reduce the residue contamination on the ball surface by preventing the amount of solid components to be dragged atop the ball surface during rapid outgassing of solvents at a faster pre-heat ramp rate.
Keywords :
copper alloys; outgassing; process heating; reflow soldering; silver alloys; surface contamination; surface mount technology; thermal analysis; tin alloys; SnAgCu; ball-attach reflow process; conventional reflow; flux material; flux residue formation; flux thermal properties; heating process simulation; lead-free surface mount technology; preheat ramp rate; residue contamination; solder paste; solvents rapid outgassing; thermal gravimetric analyzer; thermal profiling; volatiles gradual evaporation; Chemistry; Environmentally friendly manufacturing techniques; Lead; Resins; Soldering; Solids; Solvents; Surface contamination; Surface-mount technology; Testing; Ball Attach; Flux; NCF; Reflow;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1392-8
Electronic_ISBN :
978-1-4244-1392-8
Type :
conf
DOI :
10.1109/ICEPT.2007.4441442
Filename :
4441442
Link To Document :
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