DocumentCode
2903918
Title
On the Replacement of Scan Chain Inputs by Primary Input Vectors
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
fYear
2006
fDate
20-23 Nov. 2006
Firstpage
175
Lastpage
182
Abstract
We show that the functionality of scan chain inputs sometimes exists in a circuit as part of its functional operation, and can be exhibited by applying specific primary input vectors. By relying on such functionality it is possible to hide scan chains as part of a solution that addresses security. It is also possible to reduce the number of external scan chain inputs that need to be added to the circuit as part of the scan implementation, or remove the need to multiplex primary inputs as scan chain inputs. We define inherent scan in functions to capture the functionality of scan chain inputs that exists in a circuit, and show that they can be computed effectively by simulation. We address the case where multiple scan chains are to be used for the circuit
Keywords
boundary scan testing; integrated circuit testing; logic testing; primary input vectors; scan chain inputs; specific primary input vectors; Circuit simulation; Circuit testing; Cities and towns; Computational modeling; Cryptography; Data security; Decoding; Flip-flops; Hardware; Information security;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location
Fukuoka
ISSN
1081-7735
Print_ISBN
0-7695-2628-4
Type
conf
DOI
10.1109/ATS.2006.261017
Filename
4030765
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