• DocumentCode
    2903918
  • Title

    On the Replacement of Scan Chain Inputs by Primary Input Vectors

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
  • fYear
    2006
  • fDate
    20-23 Nov. 2006
  • Firstpage
    175
  • Lastpage
    182
  • Abstract
    We show that the functionality of scan chain inputs sometimes exists in a circuit as part of its functional operation, and can be exhibited by applying specific primary input vectors. By relying on such functionality it is possible to hide scan chains as part of a solution that addresses security. It is also possible to reduce the number of external scan chain inputs that need to be added to the circuit as part of the scan implementation, or remove the need to multiplex primary inputs as scan chain inputs. We define inherent scan in functions to capture the functionality of scan chain inputs that exists in a circuit, and show that they can be computed effectively by simulation. We address the case where multiple scan chains are to be used for the circuit
  • Keywords
    boundary scan testing; integrated circuit testing; logic testing; primary input vectors; scan chain inputs; specific primary input vectors; Circuit simulation; Circuit testing; Cities and towns; Computational modeling; Cryptography; Data security; Decoding; Flip-flops; Hardware; Information security;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ATS '06. 15th Asian
  • Conference_Location
    Fukuoka
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2628-4
  • Type

    conf

  • DOI
    10.1109/ATS.2006.261017
  • Filename
    4030765