Substrate Noise Reduction Based On Noise Aware Cell Design

Author

Salman, Emre ; Friedman, Eby G. ; Secareanu, Radu M. ; Hartin, Olin L.

Author_Institution

Dept. of Electr. & Comput. Eng., Rochester Univ., NY

fYear

2007

fDate

27-30 May 2007

Firstpage

3227

Lastpage

3230

Abstract

A substrate biasing methodology is introduced based on modifying standard cells by inserting dedicated substrate contacts in those cells behaving as aggressive digital noise generators. These contacts are connected to a dedicated ground network. The proposed approach reduces two primary noise injection mechanisms: ground coupling and source/drain junction coupling. Limitations of the Kelvin biasing scheme are removed while achieving more than a 60% (9 dB) reduction in substrate noise at the cost of a 12% increase in area.

Keywords

integrated circuit design; integrated circuit noise; mixed analogue-digital integrated circuits; substrates; Kelvin biasing scheme; dedicated substrate contacts; digital noise generators; ground coupling; noise aware cell design; noise injection mechanisms; source/drain junction coupling; substrate biasing; substrate noise reduction; Circuit noise; Costs; Coupling circuits; Integrated circuit noise; Kelvin; Noise generators; Noise reduction; Radio frequency; Semiconductor device noise; Substrates;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on

Conference_Location

New Orleans, LA

Print_ISBN

1-4244-0920-9

Electronic_ISBN

1-4244-0921-7

Type

conf

DOI

10.1109/ISCAS.2007.378159

Filename

4253366