• DocumentCode
    2904019
  • Title

    Characterization and Modeling of Moisture Absorption of Underfill for IC Packaging

  • Author

    Ma, Xiaosong ; Jansen, K.M.B. ; Ernst, L.J. ; van Driel, W.D. ; van der Sluis, O. ; Zhang, G.Q.

  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Underfill is a highly particle filled epoxy polymer used in flip chip to fill the gap between the leadframe and die or between die and die. In order to be able to flow in the thin gap, the silica filler particle must have a diameter below 10 mum. This epoxy underfill material mechanically couples the chip and substrate and decreases the stress in the solder joints, therefore enhancing solder fatigue life. Good adhesion between the epoxy underfill and the surface of solder ball, silicon chip, and substrate is necessary to minimize stress in a package. Use of the non-hermetic material does raise a potential concern, i.e. moisture induced interfacial delamination and moisture expansion may cause failure. In this study, moisture absorption and desorption properties were investigated, such as moisture absorption equilibrium weight gain and diffusion coefficients at different temperature and different humidity are tested and characterized, moisture absorption and desorption kinetics are tested and fitted.
  • Keywords
    absorption; desorption; filler metals; flip-chip devices; integrated circuit packaging; soldering; IC packaging; epoxy underfill material; flip chip; integrated circuits; moisture absorption characterization-modeling; moisture desorption kinetics; particle filled epoxy polymer; silica filler particle; solder joints; Absorption; Flip chip; Integrated circuit modeling; Integrated circuit packaging; Lead; Moisture; Polymers; Silicon compounds; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441451
  • Filename
    4441451