DocumentCode
2904081
Title
Test data compression based on clustered random access scan
Author
Yu Hu ; Cheng Li ; Jia Li ; Yin-He Han ; Xiao-Wei Li ; Wei Wang ; Hua-Wei Li ; Laung-Terng Wang ; Xiao-Qing Wen
Author_Institution
Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing
fYear
2006
fDate
20-23 Nov. 2006
Abstract
We proposed clustered random access scan (CRAS) architecture to reduce test data volume. CRAS makes use of the compatibility of the test stimuli to cluster the scan cells, and assigns every cluster a unique address. The compression ratio upper bound of CRAS is analyzed based on the random graph theory. Experimental results on ISCAS´89 benchmarks and two industry designs show that the proposed CRAS architecture can yield on average 67.3% reduction in test data volume, with reasonable area and routing overhead than scan design
Keywords
automatic test pattern generation; boundary scan testing; data compression; design for testability; graph theory; ISCAS´89 benchmarks; clustered random access scan; compression ratio; random graph theory; test data compression; test data volume; Automatic test pattern generation; Benchmark testing; Broadcasting; Circuit faults; Circuit testing; Decoding; Routing; Test data compression; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location
Fukuoka
ISSN
1081-7735
Print_ISBN
0-7695-2628-4
Type
conf
DOI
10.1109/ATS.2006.261025
Filename
4030773
Link To Document