DocumentCode :
2904101
Title :
Efficiently Utilizing ATE Vector Repeat for Compression by Scan Vector Decomposition
Author :
Lee, Jinkyu ; Touba, Nur A.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX
fYear :
2006
fDate :
20-23 Nov. 2006
Firstpage :
237
Lastpage :
244
Abstract :
Previous approaches for utilizing ATE vector repeat are based on identifying runs of repeated scan data and directly generating that data using ATE vector repeat. Each run requires a separate vector repeat instruction, so the amount of compression is limited by the amount of ATE instruction memory available and the length of the runs (which typically will be much shorter than the length of a scan vector). In this paper a new and more efficient approach is proposed for utilizing ATE vector repeat. The scan vector sequence is partitioned and decomposed into a common sequence which is the same for an entire cluster of test cubes and a unique sequence that is different for each test cube. The common sequence can be generated very efficiently using ATE vector repeat. Experimental results demonstrate that the proposed approach can achieve much greater compression while using many fewer vector repeat instructions compared with previous methods
Keywords :
automatic test equipment; automatic test pattern generation; boundary scan testing; circuit testing; ATE vector repeat; instruction memory; scan vector decomposition; vector repeat instruction; Automatic test pattern generation; Automatic testing; Clocks; Data engineering; Decoding; Encoding; Fault detection; Pins; Test equipment; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
ISSN :
1081-7735
Print_ISBN :
0-7695-2628-4
Type :
conf
DOI :
10.1109/ATS.2006.261026
Filename :
4030774
Link To Document :
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