Title :
A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency
Author :
Renovell, M. ; Comte, M. ; Polian, I. ; Engelke, P. ; Becker, B.
Author_Institution :
LIRMM-UMR, Montpellier
Abstract :
This paper analyzes the electrical behaviour of resistive opens as a function of their unpredictable resistance. It is demonstrated that the electrical behaviour depends on the value of the open resistance. It is also shown that detection of the open by a given vector Ti recursively depends on all the vectors that have been applied to the circuit before Ti. An electrical analysis of this recursive effect is presented and a specific ATPG strategy is proposed
Keywords :
automatic test pattern generation; electric resistance; logic testing; ATPG; electrical analysis; electrical behaviour; open resistance; recursive effect; resistive opens; sequence recursive dependency; unpredictable resistance; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Context modeling; Costs; Electric resistance; Integrated circuit modeling; Integrated circuit technology; Power system reliability;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.261031
