Title :
An Effective Test Pattern Generation for Testing Signal Integrity
Author :
Kim, Yongjoon ; Yang, Myung-Hoon ; Park, Youngkyu ; Lee, DaeYeal ; Kang, Sungho
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul
Abstract :
As more cores are integrated in a single chip with sophisticated process like nanotechnology, testing signal integrity between the cores needs much effort due to complicate coupling effects. In this paper, we propose a novel test pattern generation method for testing signal integrity. Using this method, short and effective test patterns are generated with low hardware overhead. It can be used for self-test scheme and experimental results show the effectiveness of the proposed scheme
Keywords :
integrated circuit interconnections; integrated circuit testing; system-on-chip; nanotechnology; self-test scheme; signal integrity testing; test pattern generation; Built-in self-test; Capacitance; Electronic equipment testing; Hardware; Inductance; Manufacturing processes; Mutual coupling; Signal processing; System-on-a-chip; Test pattern generators;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.261032
