An Optimum ORA BIST for Multiple Fault FPGA Look-Up Table Testing

This paper presents BIST architecture for FPGA look-up table testing using a minimum number of logic elements for its ORA. The propagation of faults in the TPGs and CUTs is formulated so that the ORA can detect multiple faults by monitoring a single signal. At the cost of using more cells for the ORA, the granularity of error detection can be reduced to as low as one fault per five LUTs. The increase in the ORA overhead, and thus the untested FPGA areas, can be compensated by more configurations. We will show that 100% test coverage and a maximum granularity can be achieved simultaneously by a reasonable number of FPGA configurations