• DocumentCode
    2904262
  • Title

    Effect of Aging on the Interfacial Reaction between Sn-9Zn-xCr Solder and Cu Substrate

  • Author

    Chen, Xi ; Hu, Anmin ; Li, Ming ; Mao, Dali

  • Author_Institution
    Shanghai Jiao Tong Univ., Shanghai
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Lhe influences of adding 0.05, 0.1, 0.3, 0.5 wt.% Cr to Sn-9Zn alloy on growth of intermetallic compound layer (IMCs) at the interface of Sn-9Zn-xCr/Cu was investigated during aging treatment at 85degC and relative humidity from 20% to 85% for 100 h, 200 h, 350 h, 500 h. Lhe results show that IMCs thickness of Sn-9Zn-Cr alloys is much thinner than that of Sn-9Zn alloy after aging, but there is little difference on IMCs thicknesses among Sn-9Zn-Cr alloys. It is of interest to note that IMCs growth rate of Sn-9Zn-Cr is about 1/4 times of that of Sn-9Zn alloy. We supposed the reason is that Cr can slow down diffusion rate of Zn in solder. It is quite reasonable to consider that reliability of Sn-9Zn-Cr solder joints is better than that of Sn-9Zn solder joints because of thinner intermetallic compound layer.
  • Keywords
    ageing; chromium alloys; solders; tin alloys; zinc alloys; Sn-Zn-Cr; aging treatment; alloy thickness; growth rate; intermetallic compound layer; relative humidity; solder joints; Aging; Chromium alloys; Copper alloys; Humidity; Intermetallic; Materials science and technology; Oxidation; Scanning electron microscopy; Soldering; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441465
  • Filename
    4441465