Title :
Dynamic data mining using an electro-optical data warehouse
Author :
Berra, P. Bruce ; Mitkas, Pericles A. ; Liuzzi, Raymond A.
Author_Institution :
PBB Syst., Wright State Univ., Canastota, NY, USA
Abstract :
Large information systems that manage terabytes of data must provide rich functionality so that interesting new applications can be addressed. Since a wealth of data, information and knowledge are resident within these vast repositories, a variety of knowledge discovery techniques have developed. These techniques are very computationally intensive and require the movement of large amounts of data. In the search for new approaches, optics may be able to help since photons have the very attractive properties of high speed, non-interference, and parallelism. Optical systems can accommodate a large number of parallel, high-bandwidth channels and optical storage devices have very high storage densities. In this research the authors postulate an electro-optical computer architecture and examine the feasibility of executing a number of alphanumeric and image knowledge discovery algorithms on large multimedia data/knowledge bases with the purpose of increasing performance and functionality
Keywords :
electro-optical devices; knowledge acquisition; multimedia computing; optical computing; optical interconnections; optical storage; very large databases; visual databases; alphanumeric algorithms; dynamic data mining; electro-optical computer architecture; electro-optical data warehouse; functionality; high speed; high-bandwidth channels; image knowledge discovery algorithms; knowledge discovery techniques; large information systems; large multimedia databases; large multimedia knowledge bases; noninterference; optical storage devices; parallelism; performance; Data mining; Data warehouses; Electron optics; High speed optical techniques; Holographic optical components; Holography; Optical computing; Optical devices; Optical interconnections; Parallel processing;
Conference_Titel :
Information Technology Conference, 1998. IEEE
Conference_Location :
Syracuse, NY
Print_ISBN :
0-7803-9914-5
DOI :
10.1109/IT.1998.713387