Title :
Functional Test Generation for Sequential Circuits
Author :
Jacob, James ; Agrawal, Vishwani D.
Author_Institution :
Indian Institute of Science
Keywords :
Automata; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Logic arrays; Logic testing; Programmable logic arrays; Sequential analysis; Sequential circuits;
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
Print_ISBN :
0-8186-2465-5
DOI :
10.1109/ICVD.1992.658015
