• DocumentCode
    2904355
  • Title

    Development and Calibration of Rogowski coils for pulsed power systems

  • Author

    Saroj, P.C. ; Agrawal, Ritu ; Roy, A. ; Menon, R. ; Singh, Sandeep ; Raul, S.R. ; Kulkarni, M.R. ; Sharma, Archana ; Nagesh, K.V. ; Chakravarthy, D.P.

  • Author_Institution
    Accel. & Pulse Power Div., Bhabha Atomic Res. Centre, Mumbai, India
  • fYear
    2011
  • fDate
    21-24 Feb. 2011
  • Firstpage
    471
  • Lastpage
    472
  • Abstract
    Rogowski coils have been used for decades for non-invasive current measurement when other probe, such as current shunts, current transformers are impracticable. The measurement of diode beam current in pulse power system under vacuum and high voltage are challenging task which requires development of Rogowski coil for specific applications. They operate in large radiation fields, under intense electron bombardment and at high di/dt. The Rogowski coil has been developed and calibrated to detect nano second pulsed currents from 10kA to 100kA with wide bandwidth and sensitivity. This paper describes Calibration of Rogowski coil used for measuring KALI-1000 pulsed power system relativistic electron beam current. Rogowski coi designed and fabricated using damping resistor technique is also described.
  • Keywords
    coils; electric current measurement; pulsed power supplies; KALI-1000 pulsed power system; Rogowski coils; current shunts; current transformers; damping resistor technique; diode beam current; intense electron bombardment; large radiation fields; nano second pulsed currents; noninvasive current measurement; pulse power system; pulsed power systems; relativistic electron beam current; Calibration; Coils; Current measurement; Pulse measurements; Resistance; Resistors; Sensitivity; Rogowski coil; Sensitivity; pulse power system; relativistic electron beam;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2011 IEEE International
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-8662-5
  • Type

    conf

  • DOI
    10.1109/IVEC.2011.5747080
  • Filename
    5747080