DocumentCode
2904479
Title
Evaluation techniques for on-line testing of robust systems based on critical tasks distribution
Author
Vaskova, Anna ; López-Ongil, Celia ; García-Valderas, Mario ; Portela-García, Marta ; Entrena, Luis
Author_Institution
Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
fYear
2011
fDate
13-15 July 2011
Firstpage
258
Lastpage
263
Abstract
The process of designing robust digital systems is getting heavier and longer due to the increase of functional complexity and circuit sensitiveness [1][2]. Furthermore, aerospace and automotive electronics are including more digital systems with critical tasks distribution among several single and cheaper modules. Although collaborative hardening is providing very interesting results in terms of cost and reliability, the design process becomes more difficult. Redundant tasks, hardware and software, must be evaluated together with the global and local error mitigation techniques. Also, network links affect error propagation and mitigation. Finally, the error accumulation must be considered in these systems working in harsh conditions. In this paper we present a general method for evaluating the Single Bit Upsets (SBU) sensitivity of complex digital systems with critical tasks distribution and collaborative hardening. This method performs a detailed analysis of signal integrity along system operation thanks to hardware emulation in the early steps of the design cycle.
Keywords
automotive electronics; space vehicle electronics; SBU sensitivity; aerospace electronics; automotive electronics; circuit sensitiveness; collaborative hardening; critical task distribution; error accumulation; error mitigation; error mitigation techniques; error propagation; evaluation techniques; functional complexity; hardware emulation; network links; online testing; robust digital system design; single-bit upset sensitivity; Circuit faults; Emulation; Hardware; Random access memory; Real time systems; Robustness; Sensitivity;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location
Athens
Print_ISBN
978-1-4577-1053-7
Type
conf
DOI
10.1109/IOLTS.2011.5994539
Filename
5994539
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