Title :
High Reliability GaAs IC Technology for Communications Systems
Author :
Reeder, Thomas M.
Author_Institution :
Marketing Manager, TriQuint Semiconductor, Inc., Tektronix Industrial Park, Group 700, P.O. Box 4935, Beaverton, OR 97075
Abstract :
Results on the reliability testing of GaAs Depletion-Mode IC´s demonstrate MTTF for individual IC components of more than 10 million hours at 125 deg. C. The opportunities for diverse GaAs IC system applications have attracted a large number of GaAs IC vendor/captive participants. However, process and device standards must be established to guarantee a sufficient supply of high reliability GaAs IC´s to the systems designer.
Keywords :
Application specific integrated circuits; Communications technology; Digital integrated circuits; Gallium arsenide; MMICs; Manufacturing; Microwave integrated circuits; Semiconductor device reliability; Substrates; USA Councils;
Conference_Titel :
Military Communications Conference, 1985. MILCOM 1985. IEEE
Conference_Location :
Boston, MA, USA
DOI :
10.1109/MILCOM.1985.4795124
