DocumentCode
2904791
Title
High Reliability GaAs IC Technology for Communications Systems
Author
Reeder, Thomas M.
Author_Institution
Marketing Manager, TriQuint Semiconductor, Inc., Tektronix Industrial Park, Group 700, P.O. Box 4935, Beaverton, OR 97075
Volume
3
fYear
1985
fDate
20-23 Oct. 1985
Firstpage
691
Lastpage
694
Abstract
Results on the reliability testing of GaAs Depletion-Mode IC´s demonstrate MTTF for individual IC components of more than 10 million hours at 125 deg. C. The opportunities for diverse GaAs IC system applications have attracted a large number of GaAs IC vendor/captive participants. However, process and device standards must be established to guarantee a sufficient supply of high reliability GaAs IC´s to the systems designer.
Keywords
Application specific integrated circuits; Communications technology; Digital integrated circuits; Gallium arsenide; MMICs; Manufacturing; Microwave integrated circuits; Semiconductor device reliability; Substrates; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Military Communications Conference, 1985. MILCOM 1985. IEEE
Conference_Location
Boston, MA, USA
Type
conf
DOI
10.1109/MILCOM.1985.4795124
Filename
4795124
Link To Document