DocumentCode :
2904808
Title :
Production Automation for GaAs MMICs
Author :
Oakes, J.G. ; Wrick, V.L.
Author_Institution :
Raytheon, SMDO, Northborough, MA 01532
Volume :
3
fYear :
1985
fDate :
20-23 Oct. 1985
Firstpage :
695
Lastpage :
695
Abstract :
The need for larger quantities of GaAs MMICs to support developmental and future production programs in radar and ECM systems has fostered the use of automated wafer fabrication and test equipment in the Pilot Production Line at Raytheon. The exclusive use of uniform, 3-inch diameter GaAs wafers has permitted the use of silicon processing equipment in the GaAs facility. Examples of improved process control and uniformity through automated equipment include the photolithography, cleaning, etching and testing areas. Increasing application of automated equipment in other labor-intensive portions of the MMIC process is inevitable.
Keywords :
Automation; Electronic countermeasures; Fabrication; Gallium arsenide; MMICs; Process control; Production systems; Radar equipment; Silicon; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 1985. MILCOM 1985. IEEE
Conference_Location :
Boston, MA, USA
Type :
conf
DOI :
10.1109/MILCOM.1985.4795125
Filename :
4795125
Link To Document :
بازگشت