Title :
In flight observation of proton induced destructive single event phenomena
Author :
Bezerra, Françoise ; Lorfèvre, Eric ; Ecoffet, Robert ; Peyre, Daniel ; Binois, Christain ; Duzellier, Sophie ; Falguere, D. ; Nuns, Thierry ; Mélotte, Michel ; Calvel, Philippe ; Marec, Ronan ; Chatry, Nathalie ; Falo, William ; Deneau, Christelle
Author_Institution :
Centre Nat. d´´Etudes Spatiales, Toulouse, France
Abstract :
MEX Experience Module is a part of CARMEN2 instrument launched in June 22 2008 aboard JASON2 satellite. This scientific instrument is dedicated to the study of the effects of space radiation environment on various electronic devices. Among all the phenomena studied in this experiment, this paper focuses on the data collected on destructive SEEs: Latch-up on commercial SRAMs and Burnout on power MOSFETs.
Keywords :
SRAM chips; aerospace instrumentation; artificial satellites; power MOSFET; protons; space vehicle electronics; CARMEN2 instrument; JASON2 satellite; MEX experience module; SRAM; electronic devices; flight observation; power MOSFET; proton induced destructive single event phenomena; scientific instrument; space radiation environment; Instruments; Ions; MOSFETs; Power supplies; Protons; Random access memory; Sensitivity; Burnout; CARMEN2; Latch-up; SEE; protons;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994566
