In flight observation of proton induced destructive single event phenomena

Author

Bezerra, Françoise ; Lorfèvre, Eric ; Ecoffet, Robert ; Peyre, Daniel ; Binois, Christain ; Duzellier, Sophie ; Falguere, D. ; Nuns, Thierry ; Mélotte, Michel ; Calvel, Philippe ; Marec, Ronan ; Chatry, Nathalie ; Falo, William ; Deneau, Christelle

Author_Institution

Centre Nat. d´´Etudes Spatiales, Toulouse, France

fYear

2009

fDate

14-18 Sept. 2009

Firstpage

126

Lastpage

132

Abstract

MEX Experience Module is a part of CARMEN2 instrument launched in June 22 2008 aboard JASON2 satellite. This scientific instrument is dedicated to the study of the effects of space radiation environment on various electronic devices. Among all the phenomena studied in this experiment, this paper focuses on the data collected on destructive SEEs: Latch-up on commercial SRAMs and Burnout on power MOSFETs.

Keywords

SRAM chips; aerospace instrumentation; artificial satellites; power MOSFET; protons; space vehicle electronics; CARMEN2 instrument; JASON2 satellite; MEX experience module; SRAM; electronic devices; flight observation; power MOSFET; proton induced destructive single event phenomena; scientific instrument; space radiation environment; Instruments; Ions; MOSFETs; Power supplies; Protons; Random access memory; Sensitivity; Burnout; CARMEN2; Latch-up; SEE; protons;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on

Conference_Location

Bruges

ISSN

0379-6566

Print_ISBN

978-1-4577-0492-5

Electronic_ISBN

0379-6566

Type

conf

DOI

10.1109/RADECS.2009.5994566

Filename

5994566