Title :
Two-Photon Absorption (TPA) backside pulsed laser tests in the LM324
Author :
López-Calle, I. ; Franco, F.J. ; Izquierdo, J.G. ; Agapito, J.A.
Author_Institution :
Dept. de Fis. Aplic. III, Univ. Complutense de Madrid, Madrid, Spain
Abstract :
Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.
Keywords :
absorption; operational amplifiers; two-photon processes; LM324; TPA backside pulsed laser test; UCM; operational amplifier; surface XY scan; two-photon absorption backside pulsed laser test; Absorption; Lasers; Measurement by laser beam; Photonics; Radiation effects; Transient analysis; Transistors; LM324; Laser; Operational Amplifiers; Single Event Transients; Two-Photon Tests;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994568
