Title :
Methodology of soft error rate computation in modern microelectronics
Author :
Zebrev, G.I. ; Ishutin, I.O. ; Useinov, R.G. ; Anashin, V.S.
Author_Institution :
Dept. of Micro- & Nanoelectron., Nat. Res. Nucl. Univ., Moscow, Russia
Abstract :
We have proposed a test methodology based on successive experimental determination of angular cross-section dependence followed be averaging over full solid angle. Equivalence between phenomenological and chord-length distribution averaging for soft error rate computation is shown. Role of energy-loss straggling in subthreshold error rate enhancement has been revealed. Nuclear reaction induced error rate computation method providing crossover between BGR and chord-length approaches has been proposed. Possibility of inclusion of multiple bit error rate estimation in a unified computational scheme is shown.
Keywords :
error statistics; integrated circuit testing; angular cross-section dependence; bit error rate estimation; burst generation rate; chord-length approach; chord-length distribution averaging; energy-loss straggling; modern microelectronics; nuclear reaction; soft error rate computation; subthreshold error rate enhancement; test methodology; unified computational scheme; Approximation methods; Error analysis; Error probability; Fluctuations; Ionization; Scalability; Solids; Energy Deposition; LET; Multiple Bit Error; Nuclear Reactions; Sensitive Volume; Soft Error Rate; Straggling;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994586
